This package contains a series of programs along with a library, mostly written in fortran-90 with some OpenCL bits, for the computation and visualization of scanning electron microscopy diffraction patterns, notably EBSD, ECP, TKD, and EKP. In addition, there are programs for TEM defect image contrast, CBED, PED, Laue x-ray diffraction, and a new series of programs for computational polarized light microscopy.
