Simulates Multidimensional Adaptive Testing using the multidimensional three-parameter logistic model as described in Segall (1996) <doi:10.1007/BF02294343>, van der Linden (1999) <doi:10.3102/10769986024004398>, Reckase (2009) <doi:10.1007/978-0-387-89976-3>, and Mulder & van der Linden (2009) <doi:10.1007/s11336-008-9097-5>.
